Reliability framework in a fabless-foundry environment

@article{Pai2009ReliabilityFI,
  title={Reliability framework in a fabless-foundry environment},
  author={S. Y. Pai and J. K. Jerry Lee and Kenny Ng and Reality Hsiao and K. C. Su and E. Chou},
  journal={2009 IEEE International Reliability Physics Symposium},
  year={2009},
  pages={229-235}
}
A collaborative framework is presented to address the reliability challenges faced in a fabless-foundry environment. Examples are given to show the effectiveness of this framework for both infant mortality and long-term reliability risk. Through design-for-reliability, optimum process standardization and selective customization, defect density reduction and electrical screening, reliability of the highest level has been achieved in FPGA devices suitable for enterprise, automotive and aerospace… CONTINUE READING