Reliability considerations in dynamic voltage and frequency scaling schemes

  title={Reliability considerations in dynamic voltage and frequency scaling schemes},
  author={Farshad Firouzi and Mostafa E. Salehi and Ali Azarpeyvand and Sied Mehdi Fakhraie and Fan Wang},
  journal={5th International Conference on Design & Technology of Integrated Systems in Nanoscale Era},
Dynamic voltage and frequency scaling (DVFS) is an effective method for controlling both energy and performance of a system. Since the increasing rate of radiation-induced transient faults depends on operating frequency and supply voltage, DVFM techniques are recently shown to have compromising advantages on electronic system reliability. Therefore, ignoring the effects of voltage scaling on fault rate could considerably decrease the system reliability. In this paper we propose a formula for… CONTINUE READING


Publications citing this paper.
Showing 1-4 of 4 extracted citations

Using the combinatorial optimization approach for DVS in high performance processors

2013 The International Conference on Technological Advances in Electrical, Electronics and Computer Engineering (TAEECE) • 2013
View 1 Excerpt

Adaptive parallelism exploitation under physical and real-time constraints for resilient systems

7th International Workshop on Reconfigurable and Communication-Centric Systems-on-Chip (ReCoSoC) • 2012
View 2 Excerpts


Publications referenced by this paper.
Showing 1-10 of 29 references

The effects of energy management on reliability in real-time embedded systems

IEEE/ACM International Conference on Computer Aided Design, 2004. ICCAD-2004. • 2004
View 4 Excerpts
Highly Influenced

Soft Error Rates with Inertial and Logical Masking

2009 22nd International Conference on VLSI Design • 2009
View 5 Excerpts

Case Study of Reliability-Aware and Low-Power Design

IEEE Transactions on Very Large Scale Integration (VLSI) Systems • 2008
View 1 Excerpt

Soft Error Rate Determination for Nanometer CMOS VLSI Logic

2008 40th Southeastern Symposium on System Theory (SSST) • 2008
View 2 Excerpts

Variation Impact on SER of Combinational Circuits

8th International Symposium on Quality Electronic Design (ISQED'07) • 2007
View 1 Excerpt

Miremadi, “Combined time and information redundancy for SEUtolerance in energy-efficient real-time systems

A. Ejlali, B. M. Al-Hashimi, M. T. Schmitz, P. Rosinger, S.G
IEEE Transactions On Very Large Scale Integration (VLSI) Systems, • 2006

Reliability-Aware Dynamic Energy Management in Dependable Embedded Real-Time Systems

IEEE Real Time Technology and Applications Symposium • 2006
View 1 Excerpt

Chip-level soft error estimation method

IEEE Transactions on Device and Materials Reliability • 2005
View 2 Excerpts

Similar Papers

Loading similar papers…