Reliability challenges of FinFET and other multi-gate MOSFETs

Abstract

In this paper by showing the results of an analytical model for the different variations of Multi-Gate MOSFETs including the FinFET., All-Around Gate MOSFET., Double-Gate MOSFET., we present a complete and detailed investigation of all the performance aspects of these novel device structures. By having the values of all the performance metrics of the… (More)

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