Reliability aware design of low power continuous-time sigma-delta modulator

@article{Cai2011ReliabilityAD,
  title={Reliability aware design of low power continuous-time sigma-delta modulator},
  author={Hao Cai and Herv{\'e} Petit and Jean-François Naviner},
  journal={Microelectronics Reliability},
  year={2011},
  volume={51},
  pages={1449-1453}
}
Circuit reliability has become a major bottleneck due to ageing degradation. In this paper, reliability-aware methodology and ageing analysis of low power sigma–delta (ΣΔ) modulator are presented. HCI and NBTI are considered as the dominating ageing effects. A second order continuous-time (CT) ΣΔ modulator is implemented for medical application. Ageing estimation is performed at both behavioral and transistor level. Results at behavioral level and transistor level show that the feedback loop in… CONTINUE READING

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