Reliability and validity of the positive and negative syndrome scale for schizophrenics.

@article{Kay1988ReliabilityAV,
  title={Reliability and validity of the positive and negative syndrome scale for schizophrenics.},
  author={Stanley R. Kay and Lewis A. Opler and Jean Pierre Lindenmayer},
  journal={Psychiatry research},
  year={1988},
  volume={23 1},
  pages={99-110}
}
The Positive and Negative Syndrome Scale (PANSS) was developed out of the need for a well-operationalized method of assessing these syndromes in schizophrenia, including their relationship to one another and to global psychopathology. We surveyed 82 acute and chronic schizophrenics to analyze the psychometric properties of the four PANSS scales. The interrater reliabilities were in the 0.80's, and significant correlations emerged with corresponding criterion measures. The PANSS positive and… CONTINUE READING
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