Reliability- and Process-variation aware design of integrated circuits — A broader perspective

@article{Alam2008ReliabilityAP,
  title={Reliability- and Process-variation aware design of integrated circuits — A broader perspective},
  author={M. Alam},
  journal={2011 International Reliability Physics Symposium},
  year={2008},
  pages={4A.1.1-4A.1.11}
}
A broad review the literature for Reliability- and Process-variation aware VLSI design shows a re-emergence of the topic as a core area of active research. Design of reliable circuits with unreliable components has been a challenge since the early days of electro-mechanical switches and have been addressed by elegant coding and redundancy techniques. And radiation hard design principles have been used extensively for systems affected by soft transient errors. Additional modern reliability… CONTINUE READING
Highly Cited
This paper has 130 citations. REVIEW CITATIONS

10 Figures & Tables

Topics

Statistics

010202009201020112012201320142015201620172018
Citations per Year

130 Citations

Semantic Scholar estimates that this publication has 130 citations based on the available data.

See our FAQ for additional information.