Reliability analysis of analog circuits using quadratic lifetime worst-case distance prediction

Abstract

This paper proposes an efficient method to predict the lifetime yield of analog circuits considering the joint effects of manufacturing process variations and parameter lifetime degradations. The method uses the idea of worst-case distance, which is an indicator of circuit robustness concerning process variations. The worst-case distance in circuit lifetime… (More)
DOI: 10.1109/CICC.2010.5617446

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