Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test

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@article{Ronchi2009ReliabilityAO, title={Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test}, author={Nicolo Ronchi and Franco Zanon and Antonio Stocco and Augusto Tazzoli and Enrico Zanoni and Gaudenzio Meneghesso}, journal={Microelectronics Reliability}, year={2009}, volume={49}, pages={1207-1210} }