Reliability Model for Electronic Devices under Time Varying Voltage

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@article{Gonzlez2016ReliabilityMF, title={Reliability Model for Electronic Devices under Time Varying Voltage}, author={Luis Carlos M{\'e}ndez Gonz{\'a}lez and Manuel Ivan Rodriguez-Borbon and Delia J. Valles-Rosales and Arturo Del Valle and Arnoldo Rodriguez}, journal={Quality and Reliability Eng. Int.}, year={2016}, volume={32}, pages={1295-1306} }