Reliability Mechanisms for Very Large Storage Systems

@inproceedings{Xin2003ReliabilityMF,
  title={Reliability Mechanisms for Very Large Storage Systems},
  author={Qin Xin and Ethan L. Miller and Thomas J. E. Schwarz and Darrell D. E. Long and Scott A. Brandt and Witold Litwin},
  booktitle={IEEE Symposium on Mass Storage Systems},
  year={2003}
}
Reliability and availability are increasingly important in large-scale storage systems built from thousands of individual storage devices. Large systems must survive the failure of individual components; in systems with thousands of disks, even infrequent failures are likely in some device. We focus on two types of errors: nonrecoverable read errors and drive failures. We discuss mechanisms for detecting and recovering from such errors, introducing improved techniques for detecting errors in… CONTINUE READING
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