Reliability Investigation of Gallium Nitride HEMT

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@article{Sozza2004ReliabilityIO, title={Reliability Investigation of Gallium Nitride HEMT}, author={A. Sozza and Christian Dua and Erwan Morvan and Bertrand Grimbert and V. Hoel and Sylvain L. Delage and N. Chaturvedi and Richard Lossy and Joachim W{\"{u}rfl}, journal={Microelectronics Reliability}, year={2004}, volume={44}, pages={1369-1373} }