Reliability Aspects of a Floating Gate E2 PROM

@article{Euzent1981ReliabilityAO,
  title={Reliability Aspects of a Floating Gate E2 PROM},
  author={B. Euzent and N. Boruta and J. Lee and C. Jenq},
  journal={19th International Reliability Physics Symposium},
  year={1981},
  pages={11-16}
}
  • B. Euzent, N. Boruta, +1 author C. Jenq
  • Published 1981
  • Computer Science, Medicine
  • 19th International Reliability Physics Symposium
  • This paper has discussed a number of E2PROM failure mechanisms for both erase/write cycling and data retention. It has been shown that Fowler-Nordheim tunneling used for programming does not affect data retention. Erase/write cycling has been shown to degrade device margins by only a small amount and is easily guardbanded. Erase/write cycling does contribute to a significant portion of the observed failure rate due to oxide breakdown under high field operation. Defect related charge loss has… CONTINUE READING
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