Reliability Analysis Framework for Structural Redundancy in Power Semiconductors

@article{Behjati2013ReliabilityAF,
  title={Reliability Analysis Framework for Structural Redundancy in Power Semiconductors},
  author={Hamid Behjati and Ali Davoudi},
  journal={IEEE Transactions on Industrial Electronics},
  year={2013},
  volume={60},
  pages={4376-4386}
}
Parallel and standby configurations can be applied to semiconductor switches to improve the reliability of power electronic converters in mission-critical applications. In this paper, the reliability models of both configurations are developed based on the Markov process. The mean time to failure (MTTF) of each configuration is derived in terms of the underlying parameters. It is demonstrated that there is a boundary condition in which both configurations have the same MTTF. This boundary… CONTINUE READING
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