Relating Yield Models to Burn-In Fall-Out in Time

@inproceedings{Barnett2003RelatingYM,
  title={Relating Yield Models to Burn-In Fall-Out in Time},
  author={Thomas S. Barnett and Adit D. Singh},
  booktitle={ITC},
  year={2003}
}
An early-life reliability model is presented that allows wafer test information to be used to predict not only the total number of burn-in failures that occur for a given product, but also the time at which they occur during burn-in testing. The model is a novel extension of an experimentally verified yield-reliability model based on the fact that defects that cause earlylife reliability (burn-in) failures are “smaller”, more subtle versions of the defects that cause failures at wafer test… CONTINUE READING
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