Refractive index profile measurements of diffused optical waveguides.

  title={Refractive index profile measurements of diffused optical waveguides.},
  author={W. E. Martin},
  journal={Applied optics},
  volume={13 9},
Refractive index profiles resulting from the fabrication of optical waveguides by diffusion techniques are measured using a reflection interferometric technique. In Cd-diffused ZnSe waveguides, the index variations are found to be complementary error functions that closely follow the composition changes for deep (>5 microm) diffusions. Shallow (<5 microm) diffusions produce waveguides in which the index profile is a complementary error function that differs significantly from the composition… CONTINUE READING