Reel-to-reel x-ray diffraction and Raman microscopy analysis of differentially heat-treated Y–BaF2–Cu precursor films on metre-length RABiTS

@inproceedings{Venkataraman2004ReeltoreelXD,
  title={Reel-to-reel x-ray diffraction and Raman microscopy analysis of differentially heat-treated Y–BaF2–Cu precursor films on metre-length RABiTS},
  author={Kartik Venkataraman and Dominc F Lee and Keith J. Leonard and L. Jun. Heatherly and Sylvester W Cook and Mariappan Parans Paranthaman and M. M{\'i}ka and Victor A. Maroni},
  year={2004}
}
Reel-to-reel x-ray diffraction (XRD) and Raman micro-spectroscopy are being evaluated as potential diagnostic tools for on-line feedback in the manufacturing of long-length coated conductors. To facilitate this evaluation, a procedure based on differentially heat-treated Y–BaF2–Cu precursors exposed to time-synchronized phase composition gradients has been developed. Two time-gradient-processed Y Ba2Cu3O7−x (YBCO) tapes of different thicknesses were fabricated using this procedure. The two… CONTINUE READING