Redundancy removal for sequential circuits without reset states

  title={Redundancy removal for sequential circuits without reset states},
  author={Kwang-Ting Cheng},
  journal={IEEE Trans. on CAD of Integrated Circuits and Systems},
In this paper, we propose methods of identifying and removing redundancy in synchronous sequential circuits that do not have a global reset state. All existing structure-level test generators use three-valued logic, which is not completely accurate, to process circuits that have an unknown initial state. A fault that is reported undetectable by such test generators is not necessarily redundant. We show that if a fault is potentially undetectable (p-undetectable), it is redundant. An algorithm… CONTINUE READING
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