Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing

@article{Wu2008ReducingPS,
  title={Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing},
  author={Meng-Fan Wu and Jiun-Lang Huang and Xiaoqing Wen and Kohei Miyase},
  journal={2008 IEEE International Test Conference},
  year={2008},
  pages={1-10}
}
Yield loss caused by excessive power supply noise has become a serious problem in at-speed scan testing. Although X-filling techniques are available to reduce the launch cycle switching activity, their performance may not be satisfactory in the linear-decompressor-based test compression environment. This work is the first to solve this problem by proposing a novel integrated ATPG scheme that efficiently and effectively performs compressible X-filling. Related theoretical principles are… CONTINUE READING
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