Recursive Path Selection for Delay Fault Testing

  title={Recursive Path Selection for Delay Fault Testing},
  author={Jaeyong Chung and Jacob A. Abraham},
  journal={2009 27th IEEE VLSI Test Symposium},
This paper presents a new path selection algorithm for delay fault testing in a statistical timing framework. Existing algorithms which consider correlation between paths use an iterative process for each path or defect and require a Monte Carlo simulation for each iteration to calculate the conditional fault probability. The proposed algorithm does not require the iteration process and selects a requested number of paths simultaneously once it performs a statistical timing analysis at the… CONTINUE READING


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