Real-Time Soft-Error Testing Results of 45-nm, High-K Metal Gate, Bulk CMOS SRAMs

@article{Seifert2012RealTimeST,
  title={Real-Time Soft-Error Testing Results of 45-nm, High-K Metal Gate, Bulk CMOS SRAMs},
  author={Norbert Seifert and Moritz Kirsch},
  journal={IEEE Transactions on Nuclear Science},
  year={2012},
  volume={59},
  pages={2818-2823}
}
We report on soft error rates of 45-nm bulk CMOS SRAMs measured in real-time testing experiments. Results are consistent with accelerated testing and demonstrate that alpha-particle induced soft error rates are negligible. 
Highly Cited
This paper has 37 citations. REVIEW CITATIONS