Random Pattern Testability

@article{Savir1984RandomPT,
  title={Random Pattern Testability},
  author={Jacob Savir and Gary S. Ditlow and Paul H. Bardell},
  journal={IEEE Transactions on Computers},
  year={1984},
  volume={C-33},
  pages={79-90}
}
A major problem in self testing with random inputs is verification of the test quality, i.e., the computation of the fault coverage. The brute-force approach of using full-fault simulation does not seem attractive because of the logic structure volume, and the CPU time encountered. A new approach is therefore necessary. This paper describes a new analytical method of computing the fault coverage that is fast compared with simulation. If the fault coverage falls below a certain threshold, it is… CONTINUE READING

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References

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SHOWING 1-9 OF 9 REFERENCES

297-302. iliary AND gate nd mpu t gna rob lit t [8] E. J. McCluskey and Bozorgui-Nesbat, "Design for autonomous test," output. If the lower bound of this signal probability is nonzero

  • W.H.P.H. Bardell
  • IEEE Trans. Comput.,
  • 1981

4Hardware techniques for testing VLSI circuits based on of self test, was discussed in this paper. The objective was to built-in test,

  • B. B. Eichelberger, T. W. Williams
  • in Proc. COMPCON
  • 1981

Probabilistic analysis of random test poses , and related topics . generation method for irredundant combinational logic networks , " Dr . Savir is a member Sigma Xi

  • Savir
  • Diagnosis and Reliable Design of Digital Systems
  • 1976

Delta - I failure detection technique

  • J. Savir Ditlow, A. Brown

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