Radiation-induced soft errors in digital circuits - A literature survey

@inproceedings{Heijmen2002RadiationinducedSE,
  title={Radiation-induced soft errors in digital circuits - A literature survey},
  author={Tino Heijmen},
  year={2002}
}
The current technical note gives an overview of the available literature on the soft error rate (SER) of semiconductor devices at sea level. The main focus is on SRAM circuits, but other memories and logic are considered also. The radiation sources causing ionizing particles in semiconductors are discussed and the physical mechanisms of the upset of data bits are treated. Reported work on soft error modeling and simulation is reviewed and test methods are summarized. The impact of technology… CONTINUE READING
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