Radiation-induced soft errors in digital circuits - A literature survey

  title={Radiation-induced soft errors in digital circuits - A literature survey},
  author={Tino Heijmen},
The current technical note gives an overview of the available literature on the soft error rate (SER) of semiconductor devices at sea level. The main focus is on SRAM circuits, but other memories and logic are considered also. The radiation sources causing ionizing particles in semiconductors are discussed and the physical mechanisms of the upset of data bits are treated. Reported work on soft error modeling and simulation is reviewed and test methods are summarized. The impact of technology… CONTINUE READING
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Publications referenced by this paper.
Showing 1-10 of 103 references

Silicon amnesia: a tutorial on radiation induced soft errors

R. C. Baumann
IRPS, • 2001
View 21 Excerpts
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Embedded robustness IPs for transient-error-free ICs

IEEE Design & Test of Computers • 2002
View 12 Excerpts
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Detailed analysis of secondary ions’ effect for the calculation of neutron-induced SER in SRAMs

G. Hubert, J. M. Palau, K. Castellani-Coulié, M. C. Calvet, S. Fourtine
IEEE Trans. Nucl. Sci., 48(6):1953–1959, Dec. • 2001
View 4 Excerpts
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Device simulation study of the SEU sensitivity of SRAMs to internal ion tracks generated by nuclear reactions

J. M. Palau, G. Hubert, +3 authors S. Fourtine
IEEE Trans. Nucl. Sci., 48(2):225–231, April • 2001
View 6 Excerpts
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Historical trend in alpha-particle induced soft error rates of the Alpha microprocessor

N. Seifert, D. Moyer, N. Leland, R. Hokinson
Proc. IEEE Int. Rel. Phys. Symp. (IRPS), pages 259–265, • 2001
View 10 Excerpts
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Simulation of nucleon-induced nuclear reactions in a simplified SRAM structure: Scaling effects on SEU and MBU cross sections

F. Wrobel, J. M. Palau, M. C. Calvet, O. Bersillon, H. Duarte
IEEE Trans. Nucl. Sci., 48(6):1946–1952, Dec. • 2001
View 8 Excerpts
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Soft errors in advanced semiconductor devices—Part I: the three radiation sources

R. C. Baumann
IEEE Trans. Dev. Mat. Rel., 1(1):17–22, Mar. • 2001
View 15 Excerpts
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TSMC 6T-SRAM soft error rate (SER) summary

T. C. Ong
TSMC, Oct. • 2001
View 8 Excerpts
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