Radiation-induced clock jitter and race

  title={Radiation-induced clock jitter and race},
  author={Norbert Seifert and Paul Shipley and M. Pant and Vinod Ambrose and Balkaran S. Gill},
  journal={2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.},
The paper assesses the reliability risk due to radiation-induced single event upsets (SEU) of clock nodes for flip flop and pulse latch based designs. Two basic upset modes are identified: radiation-induced clock jitter and radiation-induced race. Our simulation results indicate that the radiation-induced clock soft error rate (SER) cannot be neglected on the chip-level. Particularly for pulse latch based designs, upsets occurring in the clock generator have the potential to dominate the chip… CONTINUE READING
Highly Cited
This paper has 132 citations. REVIEW CITATIONS


Publications citing this paper.
Showing 1-10 of 55 extracted citations

133 Citations

Citations per Year
Semantic Scholar estimates that this publication has 133 citations based on the available data.

See our FAQ for additional information.


Publications referenced by this paper.
Showing 1-4 of 4 references

A logiclevel model for aparticle hits in CMOS circuits ”

  • H. J. Patel
  • 2002

The impact of technology scaling on soft error rate performance and limits to the efficacy o f error correction ” , Electron Devices Meeting ,

  • R. Baumann
  • Timing Vulnerability Factors of Sequentials…
  • 2002

Upset hardened memory design for submicron CMOS technology ”

  • S. Vangal, V. Veeramachaneni, P. Hazucha, V. Erraguntla, S. Borkar, R. Velazco
  • Nuclear Science
  • 1993

Similar Papers

Loading similar papers…