Radiation-induced clock jitter and race

@article{Seifert2005RadiationinducedCJ,
  title={Radiation-induced clock jitter and race},
  author={Norbert Seifert and Paul Shipley and M. Pant and Vinod Ambrose and Balkaran S. Gill},
  journal={2005 IEEE International Reliability Physics Symposium, 2005. Proceedings. 43rd Annual.},
  year={2005},
  pages={215-222}
}
The paper assesses the reliability risk due to radiation-induced single event upsets (SEU) of clock nodes for flip flop and pulse latch based designs. Two basic upset modes are identified: radiation-induced clock jitter and radiation-induced race. Our simulation results indicate that the radiation-induced clock soft error rate (SER) cannot be neglected on the chip-level. Particularly for pulse latch based designs, upsets occurring in the clock generator have the potential to dominate the chip… CONTINUE READING
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References

Publications referenced by this paper.
Showing 1-4 of 4 references

A logiclevel model for aparticle hits in CMOS circuits ”

  • H. J. Patel
  • 2002

The impact of technology scaling on soft error rate performance and limits to the efficacy o f error correction ” , Electron Devices Meeting ,

  • R. Baumann
  • Timing Vulnerability Factors of Sequentials…
  • 2002

Upset hardened memory design for submicron CMOS technology ”

  • S. Vangal, V. Veeramachaneni, P. Hazucha, V. Erraguntla, S. Borkar, R. Velazco
  • Nuclear Science
  • 1993

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