Radiation hardened by design technique to mitigate single event transients in combinational logic circuits

@article{Reddy2017RadiationHB,
  title={Radiation hardened by design technique to mitigate single event transients in combinational logic circuits},
  author={Tokala Vinay Reddy and Sangeeta Nakhate},
  journal={2017 International Conference on Recent Innovations in Signal processing and Embedded Systems (RISE)},
  year={2017},
  pages={342-347}
}
Single event transients (SETs) have become increasingly problematic for both combinational and sequential VLSI circuits in the deep submicron technology (DSM). This is due to continuously decreasing feature sizes, lower supply voltages and higher operating frequencies. Many critical applications such as biomedical, space and military electronics as well as several mainstream computing applications demand reliable circuit functionality. Therefore, the circuits used in these application must be… CONTINUE READING