Radiation Test Results of the Virtex FPGA and ZBT SRAM for Space Based Reconfigurable Computing

@inproceedings{Fuller1999RadiationTR,
  title={Radiation Test Results of the Virtex FPGA and ZBT SRAM for Space Based Reconfigurable Computing},
  author={Earl I. Fuller and Phil C. Blain and Michael P. Caffrey and Carl Carmichael and N. S. Khalsa and Anthony Salazar},
  year={1999}
}
A comprehensive Single Event Effects (SEE) characterization of advanced commercial technologies was conducted using the heavy-ion test facility at Texas A&M. The components evaluated included a 322,000 gate Virtex reprogrammable FPGA (XQVR300) from Xilinx, and several manufacturers versions of 4Meg Zero Burst Turnaround (ZBT ) SRAMs. The SRAMs all unfortunately latched-up at or below an LET of 60 MeV-cm/mg and no further testing was done. However, the Virtex FPGA was immune to single event… CONTINUE READING

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