Radiation Hardness of CCD Vertex Detectors for the ILC

@article{Sopczak2006RadiationHO,
  title={Radiation Hardness of CCD Vertex Detectors for the ILC},
  author={Andr{\'e} Sopczak and Khaled Bekhouche and Christopher Bowdery and C. J. S. Damerell and Gavin S. Davies and Lakhdar Dehimi and Tim Greenshaw and Michal Koziel and Stefanov K and Tim Woolliscroft and Steven Worm},
  journal={2006 IEEE Nuclear Science Symposium Conference Record},
  year={2006},
  volume={1},
  pages={576-582}
}
Results of detailed simulations of the charge transfer inefficiency of a prototype CCD chip are reported. The effect of radiation damage in a particle detector operating at a future accelerator is studied by examining two electron trap levels, 0.17 eV and 0.44 eV below the bottom of the conduction band. Good agreement is found between simulations using the ISE-TCAD DESSIS program and an analytical model for the 0.17 eV level. Optimum operation is predicted to be at about 250 K where the effects… 

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