Radiation-Hardened Reconfigurable Array With Instruction Roll-Back


This letter presents the design and evaluation of a coarse grained reconfigurable array, hardened against radiation induced transient errors. The architecture consists of an 8 × 8 array of reconfigurable cells, each provided with a built-in soft error detection and instruction roll-back control. We also present the communication management scheme between the processors in the presence of varying degrees of single event upsets. The impact on throughput while evaluating an 8 × 8 discrete wavelet transform (DWT) and 8 × 8 discrete cosine transform (DCT) are also presented.

DOI: 10.1109/LES.2010.2089428

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@article{Chalamalasetti2010RadiationHardenedRA, title={Radiation-Hardened Reconfigurable Array With Instruction Roll-Back}, author={Sai Rahul Chalamalasetti and Sohan Purohit and Martin Margala and Wim Vanderbauwhede}, journal={IEEE Embedded Systems Letters}, year={2010}, volume={2}, pages={123-126} }