RTL Test Pattern Generation for High Quality Loosely Deterministic BIST

@inproceedings{Santos2003RTLTP,
  title={RTL Test Pattern Generation for High Quality Loosely Deterministic BIST},
  author={Marcelino B. Santos and Jos{\'e} M. Fernandes and Isabel C. Teixeira and Jo{\~a}o Paulo Teixeira},
  booktitle={DATE},
  year={2003}
}
High quality Built-In Self Test (BIST) needs to efficiently tackle the coverage of random-pattern-resistant (r.p.r) defects. Several techniques have been proposed to cover r.p.r faults at logic level, namely, weighted pseudo-random and mixed-mode. In mixed-mode test pattern generation (TPG) techniques, deterministic tests are added to pseudo-random vectors to detect r.p.r faults. Recently, a RTL mixed-mode TPG technique has been proposed to cover r.p.r defects, the mask-based BIST technique… CONTINUE READING