RL-huffman encoding for test compression and power reduction in scan applications

  title={RL-huffman encoding for test compression and power reduction in scan applications},
  author={Mehrdad Nourani and Mohammad H. Tehranipour},
  journal={ACM Trans. Design Autom. Electr. Syst.},
This article mixes two encoding techniques to reduce test data volume, test pattern delivery time, and power dissipation in scan test applications. This is achieved by using run-length encoding followed by Huffman encoding. This combination is especially effective when the percentage of don't cares in a test set is high, which is a common case in today's large systems-on-chips (SoCs). Our analysis and experimental results confirm that achieving up to an 89&percent; compression ratio and a 93… CONTINUE READING
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