RF characterization of Josephson flux-flow transistors: design, modeling, and on-wafer measurement

@article{Zhang1995RFCO,
  title={RF characterization of Josephson flux-flow transistors: design, modeling, and on-wafer measurement},
  author={Y. Zhang and E. F. Carlsson and Dag Winkler and G. Brorsson and Herbert Zirath and E. Wikborg},
  journal={IEEE Transactions on Applied Superconductivity},
  year={1995},
  volume={5},
  pages={3385-3388}
}
Josephson flux-flow transistors based on 0-32/spl deg/ [001]-tilt YBa/sub 2/Cu/sub 3/O/sub 7/ bicrystal junctions have been fabricated with Au loops as the control current lines. In order to measure the S-parameters of the transistors, no matching elements are implemented and 50 Omega coplanar lines are used as the input and output ends of the transistors… CONTINUE READING