RBS Characteristic of Cd1−xZnxS Thin Film Fabricated by Vacuum Deposition Method

@inproceedings{Dahbi2014RBSCO,
  title={RBS Characteristic of Cd1−xZnxS Thin Film Fabricated by Vacuum Deposition Method},
  author={Noama Dahbi},
  year={2014}
}
Cd1−xZnxS thins films have been fabricated from ZnS/CdS/ZnS multilayer thin film systems, by using the vacuum deposition method; the Rutherford backscattering (RBS) technique have been applied in order to determine the: structure, composition, depth profile, and stoichiometric of these films. The influence of the chemical and heat treatments on the produced… CONTINUE READING