Quantum Computing Assisted Deep Learning for Fault Detection and Diagnosis in Industrial Process Systems

  title={Quantum Computing Assisted Deep Learning for Fault Detection and Diagnosis in Industrial Process Systems},
  author={Akshay Ajagekar and Fengqi You},
  journal={Comput. Chem. Eng.},

Quantum Computing: Fundamentals, Trends and Perspectives for Chemical and Biochemical Engineers

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Semiconductor Defect Detection by Hybrid Classical-Quantum Deep Learning

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    2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
  • 2022
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