Quantitative trait locus mapping for Verticillium wilt resistance in a backcross inbred line population of cotton (Gossypium hirsutum × Gossypium barbadense) based on RGA-AFLP analysis

@article{Fang2013QuantitativeTL,
  title={Quantitative trait locus mapping for Verticillium wilt resistance in a backcross inbred line population of cotton (Gossypium hirsutum × Gossypium barbadense) based on RGA-AFLP analysis},
  author={Hui Fang and Huiping Zhou and Soum Sanogo and Richard Flynn and Richard G. Percy and S. E. Hughs and Mauricio Ulloa and Don Jones and Jinfa Zhang},
  journal={Euphytica},
  year={2013},
  volume={194},
  pages={79-91}
}
Verticillium wilt (VW), caused by Verticillium dahliae Kleb., is one of the most important diseases in cotton. The objective of this study was to map quantitative trait loci (QTLs) conferring VW resistance using resistance gene analog (RGA)-targeted amplified fragment length polymorphism (RGA-AFLP) markers in an interspecific backcross inbred line mapping population, consisting of 146 lines from a susceptible Sure-Grow 747 (Gossypium hirsutum L.) × resistant Pima S-7 (G. barbadense L.) cross… CONTINUE READING
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