Quantitative trait loci for resistance to spot blotch caused by Bipolaris sorokiniana in wheat (T. aestivum L.) lines ‘Ning 8201’ and ‘Chirya 3’

@article{Kumar2009QuantitativeTL,
  title={Quantitative trait loci for resistance to spot blotch caused by Bipolaris sorokiniana in wheat (T. aestivum L.) lines ‘Ning 8201’ and ‘Chirya 3’},
  author={Uttam Kumar and Arun Kumar Joshi and Sanjeet Kumar and Ramesh Chand and Marion S R{\"o}der},
  journal={Molecular Breeding},
  year={2009},
  volume={26},
  pages={477-491}
}
Spot blotch caused by Bipolaris sorokiniana is a destructive disease of wheat in warm and humid wheat growing regions of the world. To identify quantitative trait loci (QTLs) for spot blotch resistance, two mapping populations were developed by making the crosses between common susceptible cultivar ‘Sonalika’ with the resistant breeding lines ‘Ning 8201’ and ‘Chirya 3’. Single seed descent derived F6, F7, F8 lines of the first cross ‘Ning 8201’ × ‘Sonalika’ were evaluated for resistance to spot… CONTINUE READING
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