Quantitative roughness characterization of geological surfaces and implications for radar signature analysis

@article{Dierking1999QuantitativeRC,
  title={Quantitative roughness characterization of geological surfaces and implications for radar signature analysis},
  author={Wolfgang Dierking},
  journal={IEEE Trans. Geosci. Remote. Sens.},
  year={1999},
  volume={37},
  pages={2397-2412}
}
  • W. Dierking
  • Published 1 September 1999
  • Environmental Science
  • IEEE Trans. Geosci. Remote. Sens.
Stochastic surface models are useful for analyzing in situ roughness profiles and synthetic aperture radar (SAR) images of geological terrain. In this paper, two different surface models are discussed: surfaces with a stationary random roughness (conventional model) and surfaces with a power-law roughness spectrum (fractal model). In the former case, it must be considered that for short profiles (L<200l/sub 0/), the measured values of rms-height s and correlation length l may be significantly… 

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