Quantitative performance measurements of bent crystal Laue analyzers for X-ray fluorescence spectroscopy.


Third-generation synchrotron radiation sources pose difficult challenges for energy-dispersive detectors for XAFS because of their count rate limitations. One solution to this problem is the bent crystal Laue analyzer (BCLA), which removes most of the undesired scatter and fluorescence before it reaches the detector, effectively eliminating detector… (More)
DOI: 10.1107/S0909049512003937


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