Quantitative measurements of thermal relaxation of isolated silicon hillocks and craters on the Si(111)-7 x 7 surface by scanning tunneling microscopy.

@article{Ichimiya1996QuantitativeMO,
  title={Quantitative measurements of thermal relaxation of isolated silicon hillocks and craters on the Si(111)-7 x 7 surface by scanning tunneling microscopy.},
  author={Ichimiya and Tanaka and Ishiyama},
  journal={Physical review letters},
  year={1996},
  volume={76 25},
  pages={4721-4724}
}

Topic