Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films.

@article{Hosseinian2013QuantitativeIS,
  title={Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films.},
  author={E. Hosseinian and O. Pierron},
  journal={Nanoscale},
  year={2013},
  volume={5 24},
  pages={
          12532-41
        }
}
  • E. Hosseinian, O. Pierron
  • Published 2013
  • Materials Science, Medicine
  • Nanoscale
  • A unique technique to perform quantitative in situ transmission electron microscopy (TEM) fatigue testing on ultrathin films and nanomaterials is demonstrated. The technique relies on a microelectromechanical system (MEMS) device to actuate a nanospecimen and measure its mechanical response. Compared to previously demonstrated MEMS-based in situ TEM techniques, the technique takes advantage of two identical capacitive sensors on each side of the specimen to measure electronically elongation… CONTINUE READING

    References

    Publications referenced by this paper.
    SHOWING 1-10 OF 92 REFERENCES