Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films.

  title={Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films.},
  author={Ehsan Hosseinian and Olivier N. Pierron},
  volume={5 24},
A unique technique to perform quantitative in situ transmission electron microscopy (TEM) fatigue testing on ultrathin films and nanomaterials is demonstrated. The technique relies on a microelectromechanical system (MEMS) device to actuate a nanospecimen and measure its mechanical response. Compared to previously demonstrated MEMS-based in situ TEM techniques, the technique takes advantage of two identical capacitive sensors on each side of the specimen to measure electronically elongation… 

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