Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films.

@article{Hosseinian2013QuantitativeIS,
  title={Quantitative in situ TEM tensile fatigue testing on nanocrystalline metallic ultrathin films.},
  author={E. Hosseinian and O. Pierron},
  journal={Nanoscale},
  year={2013},
  volume={5 24},
  pages={
          12532-41
        }
}
A unique technique to perform quantitative in situ transmission electron microscopy (TEM) fatigue testing on ultrathin films and nanomaterials is demonstrated. The technique relies on a microelectromechanical system (MEMS) device to actuate a nanospecimen and measure its mechanical response. Compared to previously demonstrated MEMS-based in situ TEM techniques, the technique takes advantage of two identical capacitive sensors on each side of the specimen to measure electronically elongation… Expand
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