Quantifying transmission electron microscopy irradiation effects using two-dimensional materials

  title={Quantifying transmission electron microscopy irradiation effects using two-dimensional materials},
  author={Toma Susi and Jannik C. Meyer and Jani Kotakoski},
  journal={Nature Reviews Physics},
Recent advances in transmission electron microscopy instrumentation have made it an indispensable technique for atomic-scale materials characterization. Concurrently, the availability of 2D materials has provided ideal samples in which each atom or vacancy can be resolved. New possibilities for the application of focused electron irradiation are being revealed, namely, the controlled manipulation of structures and even individual atoms. Evaluating the full range of possibilities for this method… 

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