Quantifying electric and magnetic field coupling from integrated circuits with TEM cell measurements

@article{Kasturi2006QuantifyingEA,
  title={Quantifying electric and magnetic field coupling from integrated circuits with TEM cell measurements},
  author={V. Kasturi and Shaozhi Deng and Todd H. Hubing and Daryl Beetner},
  journal={2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006.},
  year={2006},
  volume={2},
  pages={422-425}
}
One of the most widely used methods for evaluating the electromagnetic compatibility of integrated circuits (ICs) involves mounting the IC on a printed circuit board embedded in the wall of a TEM cell. TEM cell measurements are influenced by both electric and magnetic field coupling from the IC and its package. This paper describes how a TEM cell and a hybrid can be used to isolate electric field coupling from magnetic field coupling. Knowledge of the dominant field coupling mechanism can be… CONTINUE READING
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Measurement of Radiated Emissions from Integrated Circuits - TEM/Wideband TEM (GTEM) Cell Method; TEM Cell (150 kHz to 1 GHz), Wideband TEM Cell (150 kHz to 8 GHz)

  • J SAE
  • 2003
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