Pseudorandom Testing

  title={Pseudorandom Testing},
  author={Kenneth D. Wagner and Cary K. Chin and Edward J. McCluskey},
  journal={IEEE Transactions on Computers},
Algorithmic test generation for high fault coverage is an expensive and time-consuming process. As an alternative, circuits can be tested by applying pseudorandom patterns generated by a linear feedback shift register (LFSR). Although no fault simulation is needed, analysis of pseudorandom testing requires the circuit detectability profile. 
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