Protection of Memories Suffering MCUs Through the Selection of the Optimal Interleaving Distance

@article{Reviriego2010ProtectionOM,
  title={Protection of Memories Suffering MCUs Through the Selection of the Optimal Interleaving Distance},
  author={Pedro Reviriego and J. A. Maestro and Sanghyeon Baeg and ShiJie Wen and Richard Wong},
  journal={IEEE Transactions on Nuclear Science},
  year={2010},
  volume={57},
  pages={2124-2128}
}
Interleaving, together with single error correction codes (SEC), are common techniques to protect memories against multiple cell upsets (MCUs). This kind of errors is increasingly important as technology scales, becoming a prominent effect, and therefore greatly affecting the reliability of memories. Ideally, the interleaving distance (ID) should be chosen as the maximum expected MCU size. In this way, all errors in an MCU would occur in different logical words, thus being correctable by the… CONTINUE READING
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