Project White Paper-Contourlet Transforms for Feature Detection

  title={Project White Paper-Contourlet Transforms for Feature Detection},
  author={Wei-shi Tsai},
This project will involve the exploration of a directional extension of multidimensional wavelet transforms, called “contourlets”, to perform pattern recognition. First, the general concept of a directional extension vs. a regular multidimensional wavelet transform will be discussed and explain the reasoning behind the directional extension. Then, an objective comparison will be done using sample images between the wavelet transform and other edge detection methods for feature detection. 

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