Production lead time reduction in a semiconductor capital equipment manufacturing plant through optimized testing protocols

@inproceedings{Bhadauria2014ProductionLT,
  title={Production lead time reduction in a semiconductor capital equipment manufacturing plant through optimized testing protocols},
  author={Anubha Singh Bhadauria},
  year={2014}
}
Processes at a semiconductor equipment manufacturing facility were studied with the goal to reduce the production lead time. Based on the principles of lean manufacturing, DMAIC methodology was used to guide the process. Value Stream Mapping (VSM) of the whole process was done to determine that the Universal End Station (UES) was the module with the longest lead time. This work focuses on the optimization of the testing process on the UES. Time studies were conducted for the assembly and test… CONTINUE READING

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