Process variation and temperature-aware reliability management

@article{Zhuo2010ProcessVA,
  title={Process variation and temperature-aware reliability management},
  author={Cheng Zhuo and Dennis Sylvester and David Blaauw},
  journal={2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010)},
  year={2010},
  pages={580-585}
}
In aggressively scaled technologies, reliability concerns such as oxide breakdown have become a key issue. Dynamic reliability management (DRM) has been proposed as a mechanism to dynamically explore the tradeoff between system performance and reliability margin. However, existing DRM methods are hampered by the fact that they do not accurately model spatial and temporal variations in process and temperature parameters which have a strong impact on chip reliability. In addition, they make the… CONTINUE READING

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  • Experiments on an Alphalike processor show our DRM framework fully utilizes the available margin and achieves 28.7% performance improvement on average.

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