Probing the local temperature by in situ electron microscopy on a heated Si(3)N(4) membrane.


We present a method allowing us to obtain localized heating that is compatible with high-temperature operation and real time scanning and transmission electron microscopy. Localized heating is induced by flowing current through tungsten nanowires deposited by focused ion-beam-induced deposition on a 50-nm-thick Si(3)N(4) membrane. Based on the heat… (More)
DOI: 10.1016/j.ultramic.2009.09.006


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