Probing the limits of the rigid-intensity-shift model in differential-phase-contrast scanning transmission electron microscopy

@article{Clark2018ProbingTL,
  title={Probing the limits of the rigid-intensity-shift model in differential-phase-contrast scanning transmission electron microscopy},
  author={Laura Clark and Hamish G. Brown and David M. Paganin and Michael John Morgan and T. Matsumoto and Naoya Shibata and Timothy C. Petersen and Scott D. Findlay},
  journal={Physical Review A},
  year={2018},
  volume={97},
  pages={043843}
}
The rigid-intensity-shift model of differential phase contrast scanning transmission electron microscopy (DPC-STEM) imaging assumes that the phase gradient imposed on the probe by the sample causes the diffraction pattern intensity to shift rigidly by an amount proportional to that phase gradient. This behaviour is seldom realised exactly in practice. Through a combination of experimental results, analytical modelling and numerical calculations, we explore the breakdown of the rigid-intensity… 

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