• Corpus ID: 247025932

Probing quantum devices with radio-frequency reflectometry

  title={Probing quantum devices with radio-frequency reflectometry},
  author={Florian Vigneau and F. Fedele and Anasua Chatterjee and David J. Reilly and Ferdinand Kuemmeth and Fernando Gonzalez-Zalba and Edward A. Laird and Natalia Ares},
Many important phenomena in quantum devices are dynamic, meaning that they cannot be studied using time-averaged measurements alone. Experiments that measure such transient effects are collectively known as fast readout. One of the most useful techniques in fast electrical readout is radio-frequency reflectometry, which can measure changes in impedance (both resistive and reactive) even when their duration is extremely short, down to a microsecond or less. Examples of reflectometry experiments… 
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