Probing Organic Thin Films by Coherent X-ray Imaging and X-ray Scattering

@article{Patil2019ProbingOT,
  title={Probing Organic Thin Films by Coherent X-ray Imaging and X-ray Scattering},
  author={Nilesh Patil and Theyencheri Narayanan and Leander Michels and Eirik Torbj{\o}rn Bakken Skj{\o}nsfjell and Manuel Guizar‐Sicairos and Niko Van den Brande and Raf Claessens and Bruno Van Mele and Dag Werner Breiby},
  journal={ACS Applied Polymer Materials},
  year={2019}
}
An important and integral effort toward understanding the formation and reorganization of mesoscale structures in functional organic thin films, being of fundamental importance to the development of tomorrow’s green energy technologies, is the continuous sharpening of the experimental analytical tools used to observe and quantify these structures. In this study we present a combined investigation of organic thin films by small-angle X-ray scattering (SAXS) and the relatively new technique of… 

Figures and Tables from this paper

Synchrotron Scattering Methods for Nanomaterials and Soft Matter Research
TLDR
An overview of broad range of applications of synchrotron scattering methods in the investigation of nanoscale materials allows the elucidation of the structure and dynamics of nanomaterials from sub-nm to micron size scales and down to sub-millisecond time ranges both in bulk and at interfaces.

References

SHOWING 1-10 OF 78 REFERENCES
X-Ray Nanoscopy of a Bulk Heterojunction
Optimizing the morphology of bulk heterojunctions is known to significantly improve the photovoltaic performance of organic solar cells, but available quantitative imaging techniques are few and have
The Active Layer Morphology of Organic Solar Cells Probed with Grazing Incidence Scattering Techniques
TLDR
Grazing incidence X-ray scattering provides unique insights into the morphology of active materials and thin film layers used in organic photovoltaic devices and conjugated polymers, such as poly(3-hexylthiophene) (P3HT).
Near-edge X-ray absorption fine-structure microscopy of organic and magnetic materials.
TLDR
The ability of soft X-ray microscopy to provide information that is otherwise inaccessible is reviewed and exemplified, and a perspective on future developments is discussed.
Development of an ultra-small-angle X-ray scattering instrument for probing the microstructure and the dynamics of soft matter
A Bonse–Hart camera suitable for studying dilute and weakly scattering systems has been developed. The required level of reduction of the parasitic background scattering was realised by replacing
Scanning transmission x-ray microscopy of polymer nanoparticles: probing morphology on sub-10 nm length scales.
TLDR
Structural modelling demonstrates that the STXM technique is capable of quantifying morphological features on a sub-10 nm length scale; below the spot size of the incident focused x-ray beam, which has important implications for the development of water-based 'solar paints' fabricated from microemulsions of semiconducting polymers.
Simulating X-ray diffraction of textured films
Computationally efficient simulations of grazing-incidence X-ray diffraction (GIXD) are discussed, with particular attention given to textured thin polycrystalline films on supporting substrates. A
High-Resolution Scanning X-ray Diffraction Microscopy
TLDR
A ptychographic imaging method is demonstrated that bridges the gap between CDI and STXM by measuring complete diffraction patterns at each point of a STXM scan.
Quantitative nanoorganized structural evolution for a high efficiency bulk heterojunction polymer solar cell.
TLDR
An improved small-angle X-ray scattering (SAXS) model and analysis methodology is developed to quantitatively evaluate the nanostructures of a blend system and significantly extend the current knowledge of the relationship of bulk heterojunction morphology to device performance.
High-resolution non-destructive three-dimensional imaging of integrated circuits
TLDR
It is demonstrated that X-ray ptychography—a high-resolution coherent diffractive imaging technique—can create three-dimensional images of integrated circuits of known and unknown designs with a lateral resolution in all directions down to 14.6 nanometres.
Simultaneous Use of Small‐ and Wide‐Angle X‐ray Techniques to Analyze Nanometerscale Phase Separation in Polymer Heterojunction Solar Cells
Using grazing-incidence small-angle X-ray scattering and wide-angle X-ray diffraction techniques to analyze the nanoscale phase separation of P3HT and PCBM after annealing, the effects of the sizes
...
...