Probe-device detecting single carriers: A new method for deep level characterization with nanosecond resolution

Abstract

Single carriers emitted by deep levels can be detected with high time resolution in a probe device. The probe is a suitable junction structure, in which a carrier can trigger a macroscopic avalanche current pulse. A new method, conceptually similar to those employed for fluorescent and nuclear decays, can thus be used for studying deep levels: time… (More)

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